Reliable Low-Cost Fabrication of Low-Loss $\Hbox{Al}_{2}\hbox{O} _{3}{:}\hbox{Er}^{3+}$ Waveguides With 5.4-dB Optical Gain

IEEE Journal of Quantum Electronics- United States

doi 10.1109/jqe.2009.2013365

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Date

May 1, 2009

Authors

Kerstin Worhoff

Jonathan D. B. Bradley

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

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Reliable Low-Cost Fabrication of Low-Loss $\Hbox{Al}_{2}\hbox{O} _{3}{:}\hbox{Er}^{3+}$ Waveguides With 5.4-dB Optical Gain

IEEE Journal of Quantum Electronics- United States

Full Text

Abstract

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Charging-Induced Changes in Reverse Current–Voltage Characteristics of Al/Al-Rich $\Hbox{Al}_{2}\hbox{O}_{3}/\Hbox{p-Si}$ Diodes

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Amanote Research

Reliable Low-Cost Fabrication of Low-Loss $\Hbox{Al}_{2}\hbox{O} _{3}{:}\hbox{Er}^{3+}$ Waveguides With 5.4-dB Optical Gain

IEEE Journal of Quantum Electronics- United States

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Charging-Induced Changes in Reverse Current&#x2013;Voltage Characteristics of Al/Al-Rich $\Hbox{Al}_{2}\hbox{O}_{3}/\Hbox{p-Si}$ Diodes

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Heat Capacity, Thermal Expansion and Barocaloric Effect in Fluoride $$\Hbox {K}_{2}\hbox {TaF}_{7}$$ K 2 TaF 7

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Charging-Induced Changes in Reverse Current–Voltage Characteristics of Al/Al-Rich $\Hbox{Al}_{2}\hbox{O}_{3}/\Hbox{p-Si}$ Diodes