Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927615007837
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

FIB TEM Sample Preparation of Deeply Buried Interfaces

Microscopy and Microanalysis
Instrumentation
2011English

FIB Dual-Beam Sample Preparation for TEM Observation

Microscopy and Microanalysis
Instrumentation
2003English

Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method

Microscopy and Microanalysis
Instrumentation
2010English

Comparison of Fib Tem Specimen Preparation Methods

Microscopy and Microanalysis
Instrumentation
2002English

FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System

Microscopy and Microanalysis
Instrumentation
2006English

Planarization Processes for Pre-Fib Sample Preparation

Microscopy and Microanalysis
Instrumentation
2002English

A Newly Developed Fib System for Tem Specimen Preparation

Microscopy and Microanalysis
Instrumentation
2002English

Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;

Materia Japan
2012English

TEM Foil Preparation From Irradiated Metallic Materials: A Practical Approach

Journal of Environmental Science and Engineering B
2015English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy