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TESTCHIP: A Chip for Weighted Random Pattern Generation, Evaluation, and Test Control

IEEE Journal of Solid-State Circuits - United States
doi 10.1109/4.92026
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Abstract

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Categories
Electronic EngineeringElectrical
Date

July 1, 1991

Authors
A.P. StroleH.-J. Wunderlich
Publisher

Institute of Electrical and Electronics Engineers (IEEE)


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