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Determining the Interfacial Density of States in Metal-Insulator-Semiconductor Devices Based on Poly(3-Hexylthiophene)
Applied Physics Letters
- United States
doi 10.1063/1.2897238
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Categories
Astronomy
Physics
Date
March 10, 2008
Authors
N. Alves
D. M. Taylor
Publisher
AIP Publishing
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