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Intrinsic Parameter Fluctuations in Conventional MOSFETs Until the End of the ITRS: A Statistical Simulation Study
Journal of Physics: Conference Series
- United Kingdom
doi 10.1088/1742-6596/38/1/045
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Categories
Astronomy
Physics
Date
May 10, 2006
Authors
G Roy
F Adamu-Lema
A R Brown
S Roy
A Asenov
Publisher
IOP Publishing
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