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Publications by A. J. Melmed
The COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF a Ni-Base SUPERALLOY
Le Journal de Physique Colloques
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Characterization of Ni-Base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques
Microscopy and Microanalysis
Instrumentation
Analytical Transmission Electron Microscopy
Reviews in Mineralogy and Geochemistry
Petrology
Geochemistry
Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Analytical Transmission Electron Microscopy in Minerals Processing
Characterization of Phosphorus Segregation in Neutron-Irradiated Pressure Vessel Steels by Atom Probe Field Ion Microscopy
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Transmission Electron Microscopy
Springer Series in Optical Sciences
Optical
Electronic
Magnetic Materials
Nanorobotics for Electron and Ion Microscopy
Microscopy and Microanalysis
Instrumentation
The Electron Microscopy Database: An Online Resource for Teaching and Learning Quantitative Transmission Electron Microscopy
Microscopy Today
Reactive Ion Etching: Optimized Diamond Membrane Fabrication for Transmission Electron Microscopy
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology