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Publications by A. Sassella

Ellipsometric Characterization of Amorphous and Polycrystalline Silicon Films Deposited Using a Single Wafer Reactor

Applied Physics Letters
AstronomyPhysics
1997English

In-Situ Study of the Interface Formation in Organic Multilayers

Superlattices and Microstructures
Electronic EngineeringElectricalCondensed Matter PhysicsMaterials Science
2008English

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