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Publications by A.C. Twitchett
Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased P-N Junctions From Electron Holograms
Microscopy and Microanalysis
Instrumentation
Related publications
Characterization of Multilayer Ferromagnetic Nanowire Arrays Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Magnetic Imaging of Skyrmions in FeGe Using Off-Axis Electron Holography
Quantitative Dopant Profiling of P-N Junction in InGaAs∕AlGaAs Light-Emitting Diode Using Off-Axis Electron Holography
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Live Measurement of Electrical Charge Density in Materials Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Exploring CCD Camera Parameters With Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Exit-Surface Dependency of Defocus Measured by Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Direct Measurement of Barrier Asymmetry inAlOx∕ZrOymagnetic Tunnel Junctions Using Off-Axis Electron Holography
Physical Review B
Study of Magnetic Domain Structure in Co(Fe)/Pd Multilayers Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode Using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM
Microscopy and Microanalysis
Instrumentation
