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Publications by A.R. Krauss
In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Fullerenes as Precursors for Diamond Film Growth Without Hydrogen or Oxygen Additions
Related publications
In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Morphology and Spectroscopic Ellipsometry of PMMA Thin Films
Applied Physics Research
Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Studies on Inx(As2Se3)1-X Thin Films Using Variable Angle Spectroscopic Ellipsometry (VASE)
Materials Science-Poland
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
In-Situ Spectroscopic Studies of Electrochromic Hydrated Nickel Oxide Films
Solar Energy Materials
Aging of Oxygen-Treated Trimethylsilane Plasma-Polymerized Films Using Spectroscopic Ellipsometry
Journal of Atomic, Molecular, and Optical Physics
