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Publications by B. Gault
Atom Probe Characterization of Corroded Alloy 600
Microscopy and Microanalysis
Instrumentation
Correlative Transmission EBSD-APT Analysis of Grain Boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 Based Thin-Film Solar Cells
Microscopy and Microanalysis
Instrumentation
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Atom Probe Tomography Characterization of Multilayer Films
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Nuclear Materials Characterization by Tomographic Atom Probe
EPJ Web of Conferences
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Atom Probe Tomography—A Cornerstone in Materials Characterization
MRS Bulletin
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Atom Probe Tomography: A Technique for Nanoscale Characterization
Microscopy and Microanalysis
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Atom Probe Tomography of Radiation-Induced Precipitation in Ferritic-Martensitic Alloy HCM12A
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Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Atom-Probe Analysis of Zircaloy
Le Journal de Physique Colloques
A Novel Oxide Characterization Method of Nickel Base Alloy 600 Used in Nuclear Plant Reactors
Development of the Scanning Atom Probe
Microscopy and Microanalysis
Instrumentation