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Publications by B. Gault

Atom Probe Characterization of Corroded Alloy 600

Microscopy and Microanalysis
Instrumentation
2013English

Correlative Transmission EBSD-APT Analysis of Grain Boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 Based Thin-Film Solar Cells

Microscopy and Microanalysis
Instrumentation
2017English

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Atom Probe Tomography Characterization of Multilayer Films

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Nuclear Materials Characterization by Tomographic Atom Probe

EPJ Web of Conferences
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Atom Probe Tomography—A Cornerstone in Materials Characterization

MRS Bulletin
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Atom Probe Tomography: A Technique for Nanoscale Characterization

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2002English

Atom Probe Tomography of Radiation-Induced Precipitation in Ferritic-Martensitic Alloy HCM12A

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2009English

Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.

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1992English

Atom-Probe Analysis of Zircaloy

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1986English

A Novel Oxide Characterization Method of Nickel Base Alloy 600 Used in Nuclear Plant Reactors

2013English

Development of the Scanning Atom Probe

Microscopy and Microanalysis
Instrumentation
2003English

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