Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by C Karthikeyini
A New Hybrid Test Pattern Generator for Stuck-At –Fault and Path Delay Fault in Scan Based Bist
International Journal of Engineering and Technology(UAE)
Architecture
Hardware
Engineering
Chemical Engineering
Biotechnology
Environmental Engineering
Computer Science
Related publications
Deterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST
A Delay Fault Model for At-Speed Fault Simulation and Test Generation
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
Computer Science Applications
Computer Graphics
Computer-Aided Design
Software
Multiple-Fault Diagnosis Based on Adaptive Diagnostic Test Pattern Generation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Fault Diagnosis and Fault-Tolerant Control for System With Fast Time-Varying Delay
Automatika
Control
Systems Engineering
Computer Science
Reducibility of Sequential Test Generation to Combinational Test Generation for Several Delay Fault Models
Printing Fault Classification Based on Hybrid Method
Information Technology Journal
Fault-Tolerant Control Based on Hybrid Redundancy
Transactions of the Institute of Systems, Control and Information Engineers
Fault Feature Extraction of Bearing Fault in Wind Turbine Generator Based on the Variational Modal Decomposition and Spectral Kurtosis
Power Reduction in Test-Per-Scan BIST With Supply Gating and Efficient Scan Partitioning
