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Publications by C. C. Fulton
Electronic Properties of the Zr–ZrO2–SiO2–Si(100) Gate Stack Structure
Journal of Applied Physics
Astronomy
Physics
Related publications
Structures and Electronic States of Si/SiO2 Interface.
Hyomen Kagaku
Gate-Stack Engineering for Self-Organized Ge-Dot/SiO2/SiGe-Shell MOS Capacitors
Frontiers in Materials
Materials Science
Dielectric and Optical Properties of Zr Silicate Thin Films Grown on Si(100) by Atomic Layer Deposition
Journal of Applied Physics
Astronomy
Physics
Electronic Structure, Phase Stability, and Cohesive Properties ofTi2XAl(X=Nb,V,Zr)
Physical Review B
Defect Generation at SiO2/Si(100) Interfaces by Metal Contamination
Structure of PbTe(SiO2)/SiO2multilayers Deposited on Si(111)
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Frequency and Gate Voltage Effects on the Dielectric Properties and Electrical Conductivity of Al/SiO2/P-Si Metal-Insulator-Semiconductor Schottky Diodes
Journal of Applied Physics
Astronomy
Physics
X‐ray Scattering Studies of the SiO2/Si(001) Interfacial Structure
Applied Physics Letters
Astronomy
Physics
Structural and Electronic Properties of the SiC (100) Surfaces
Brazilian Journal of Physics
Astronomy
Physics
