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Publications by D Saxey
Characterization of Ni-Base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques
Microscopy and Microanalysis
Instrumentation
Related publications
Studying the Atomic Structures by Aberration-Corrected and Conventional Electron Microscopy
Microscopy and Microanalysis
Instrumentation
The COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF a Ni-Base SUPERALLOY
Le Journal de Physique Colloques
Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
The superSTEM: An Aberration Corrected Analytical Microscopy Facility
Microscopy and Microanalysis
Instrumentation
Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Probing Catalytic Surfaces by Correlative Scanning Photoemission Electron Microscopy and Atom Probe Tomography
Journal of Materials Chemistry A
Materials Science
Chemistry
the Environment
Sustainability
Renewable Energy
Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope
Microscopy and Microanalysis
Instrumentation
Introduction: The Otto Scherzer Special Issue on Aberration-Corrected Electron Microscopy
Microscopy and Microanalysis
Instrumentation
