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Publications by David Holburn

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Advances in OptoElectronics
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2011English

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Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2

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Introduction to the Scanning Electron Microscope

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Cell Surface and Cell Outline Imaging in Plant Tissues Using the Backscattered Electron Detector in a Variable Pressure Scanning Electron Microscope

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