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Publications by Dennis Keiser

Challenges and Opportunities on Elucidating Irradiated Fuels With Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2018English

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Introduction: Special Issue on Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2007English

New Applications in Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2013English

An Introduction to Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2003English

Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis
Instrumentation
2003English

Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)

Advanced Materials Interfaces
Mechanics of MaterialsMechanical Engineering
2017English

Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM

Microscopy and Microanalysis
Instrumentation
2013English

Atom-Probe Tomography of Semiconductor Materials and Device Structures

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2009English

Atom Probe Tomography: A Technique for Nanoscale Characterization

Microscopy and Microanalysis
Instrumentation
2002English

Atom Probe Tomography—A Cornerstone in Materials Characterization

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2016English

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