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Publications by E Okunishi

Cross-Section of Asbestos Prepared for TEM/STEM With Ion Slicer

Microscopy and Microanalysis

Instrumentation

English

Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

Microscopy and Microanalysis

Instrumentation

English

Related publications

Observation of Cross Sectional Semiconductor Sample With Newly Developed SEI/STEM/TEM Microscope

Microscopy and Microanalysis

Instrumentation

English

Atomic Negative-Ion-Photodetachment Cross-Section and Affinity Measurements

Journal of Research of the National Bureau of Standards

English

Repeatability of Automated FIB Prepared TEM Samples With Low keV Cleaning

Microscopy and Microanalysis

Instrumentation

English

Optimization of Ion Millers for TEM Sample Preparation

Microscopy Today

English

Benefits and Possibilities of Cc–Correction for TEM / STEM

Microscopy and Microanalysis

Instrumentation

English

Nanomilling for Aberration – Corrected TEM and HAADF STEM

Microscopy and Microanalysis

Instrumentation

English

Algorithm for Radar Cross Section Estimation

IOSR Journal of Engineering

English

Hydraulic Calculation of Channels With Composed Cross Section

Environmental Engineering and Management Journal

Environmental Engineering

English

Variation of Photoneutron Cross Section With Mass Number

Acta Physica Polonica A

English