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Publications by E. A. Kenik
Atom Probe Tomography: A Technique for Nanoscale Characterization
Microscopy and Microanalysis
Instrumentation
Precipitation in MA/ODS Ferritic Alloy MA957
Microscopy and Microanalysis
Instrumentation
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Atom Probe Tomography—A Cornerstone in Materials Characterization
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Atom Probe Tomography and Correlative Microscopy: 3D Nanoscale Characterization of Metals, Minerals and Materials
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Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
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Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography
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Three Dimensional Atom Probe Tomography of Nanoscale Thin Films, Interfaces and Particles
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
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An Introduction to Atom Probe Tomography
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Introduction: Special Issue on Atom Probe Tomography
Microscopy and Microanalysis
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Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
Advanced Materials Interfaces
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Mechanical Engineering