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Publications by Fang-Hsing Wang

Turn-Around Phenomenon in the Degradation Trend of N-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors Under DC Bias Stress

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
EngineeringAstronomyPhysics
2010English

Physical Properties of ZnO Thin Films Codoped With Titanium and Hydrogen Prepared by RF Magnetron Sputtering With Different Substrate Temperatures

Journal of Nanomaterials
Materials ScienceNanotechnologyNanoscience
2015English

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