Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Fang-Hsing Wang
Turn-Around Phenomenon in the Degradation Trend of N-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors Under DC Bias Stress
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Physical Properties of ZnO Thin Films Codoped With Titanium and Hydrogen Prepared by RF Magnetron Sputtering With Different Substrate Temperatures
Journal of Nanomaterials
Materials Science
Nanotechnology
Nanoscience
Related publications
Low-Temperature Growth Process of Polycrystalline Silicon for Thin Film Transistors.
SHINKU
Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Effective Density-Of-States Distribution of Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Degradation
Journal of Applied Physics
Astronomy
Physics
Instability of Threshold Voltage Under DC Drain Bias Stress in Pentacene-Based Organic Thin Film Transistors
Bias Stress Effects in Organic Thin Film Transistors
Gate-All-Around Polycrystalline-Silicon Thin-Film Transistors With Self-Aligned Grain-Growth Nanowire Channels
Applied Physics Letters
Astronomy
Physics
Suppress Temperature Instability of InGaZnO Thin Film Transistors by N2O Plasma Treatment, Including Thermal-Induced Hole Trapping Phenomenon Under Gate Bias Stress
Applied Physics Letters
Astronomy
Physics
Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors
Instability of Amorphous-Indium Gallium Zinc Oxide (A-Igzo) Thin Film Transistors Under DC and AC Bias Stress
