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Publications by Francois Vurpillot
Simulation Tools for Atom Probe Tomography: A Path for Diagnosis and Treatment of Image Degradation
Materials Characterization
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Recent Reconstruction Developments in IVAS
Microscopy and Microanalysis
Instrumentation
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Atom Probe Tomography: A Technique for Nanoscale Characterization
Microscopy and Microanalysis
Instrumentation
Characterization Tools: Atom Probe Tomography for 3D Structural and Chemical Analysis of Individual Proteins (Small 24/2019)
Small
Materials Science
Nanoscience
Engineering
Biomaterials
Medicine
Biotechnology
Nanotechnology
Chemistry
An Integrated Data Driven Reconstruction and Molecular Dynamics Simulation for Lattice Structure in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography—A Cornerstone in Materials Characterization
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
Instrumentation
Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography
Crystals
Materials Science
Inorganic Chemistry
Chemical Engineering
Condensed Matter Physics
Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
Advanced Materials Interfaces
Mechanics of Materials
Mechanical Engineering
