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Publications by G. A. M. Amin
Studies on Inx(As2Se3)1-X Thin Films Using Variable Angle Spectroscopic Ellipsometry (VASE)
Materials Science-Poland
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Related publications
In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes
Morphology and Spectroscopic Ellipsometry of PMMA Thin Films
Applied Physics Research
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Spectroscopic Ellipsometry Study of Organic-Inorganic Halide: FAPbIxBr3−x Perovskite Thin Films by Two-Step Method
InP Optical Constants Between 0.75 and 5.0 eV Determined by Variable‐angle Spectroscopic Ellipsometry
Journal of Applied Physics
Astronomy
Physics
Studies of Thin Strained InAs, AlAs, and AlSb Layers by Spectroscopic Ellipsometry
Journal of Applied Physics
Astronomy
Physics
In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Aging of Oxygen-Treated Trimethylsilane Plasma-Polymerized Films Using Spectroscopic Ellipsometry
Journal of Atomic, Molecular, and Optical Physics
