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Publications by H. Homma
The Characterization of Interface Roughness and Other Defects in Multilayers by X-Ray Scattering
Science and Technology of Nanostructured Magnetic Materials
Related publications
Nonspecular X-Ray Reflectivity Study of Roughness Scaling in Si/Mo Multilayers
Journal of Applied Physics
Astronomy
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Soft X-Ray Magnetic Scattering Study of Thin Films and Multilayers
Materials Research Society Symposium - Proceedings
Mechanics of Materials
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Mechanical Engineering
Dense Matter Characterization by X-Ray Thomson Scattering
Journal of Quantitative Spectroscopy and Radiative Transfer
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Defects and Polytypism in SiC: The Role of Diffuse X-Ray Scattering
Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging
Preparation and Characterization of Sputtered Multilayers for Soft X-Ray Reflectors.
The Review of Laser Engineering
Diffuse X-Ray Scattering From Defects in GaN Epitaxial Layers
Acta Crystallographica Section A Foundations of Crystallography
Interface Reaction Characterization and Interfacial Effects in Multilayers
Correction: Structural Characterization of the Saccharomyces Cerevisiae THO Complex by Small-Angle X-Ray Scattering
PLoS ONE
Multidisciplinary
