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Publications by Hideki Satake
Effects of Aluminum and Nitrogen Profile Control on Electrical Properties of HfAlON Gate Dielectric MOSFETs
Common Origin of Stress-Induced Leakage Current and Electron Trap Generation
Related publications
Frequency and Gate Voltage Effects on the Dielectric Properties and Electrical Conductivity of Al/SiO2/P-Si Metal-Insulator-Semiconductor Schottky Diodes
Journal of Applied Physics
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Electrical Characteristics and Reliability Properties of Metal-Oxide-Semiconductor Field-Effect Transistors With La2O3 Gate Dielectric
Journal of Applied Physics
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Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon
IEEE Transactions on Electron Devices
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Improved Electrical Properties of Metal-Oxide-Semiconductor Capacitor With HfTiON Gate Dielectric by Using HfSiON Interlayer
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Sub-Micron, Metal Gate, High-к Dielectric, Implant-Free, Enhancement-Mode III-V Mosfets
Effects of Different Annealing Gases on Pentacene OTFT With HfLaO Gate Dielectric
IEEE Electron Device Letters
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Improved Electrical Properties of Ge Metal-Oxide-Semiconductor Capacitor With HfTa-based Gate Dielectric by Using TaOxNy Interlayer
Applied Physics Letters
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Influence of Physical and Geometrical Parameters on Electrical Properties of Short Gate GaAs MESFETs
Semiconductor Physics, Quantum Electronics and Optoelectronics
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Atomic
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Electrical Properties of Crystalline YSZ Films on Silicon as Alternative Gate Dielectrics
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