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Publications by I. Wylie
Characterization of Si in a W Matrix Using Diffraction Contrast in the TEM
Microscopy and Microanalysis
Instrumentation
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Suspended DNA Structural Characterization by TEM Diffraction
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Contrast Enhancement for Lipid NanoParticles (LNPs) Characterization Using Transmission Electron Microscopy (TEM)
Microscopy and Microanalysis
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Relative Contrast in A-Si and C-Si in ADF-STEM Imaging
Microscopy and Microanalysis
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In Depth Characterization of Ge-Si Core-Shell Nanowires Using X-Ray Coherent Diffraction and Time Resolved Pump-Probe Spectroscopy
Journal of Applied Physics
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X-Ray Powder Diffraction Characterization of the Elusive Tetraphosphine Si(CH2PPh2)4 Silane
Powder Diffraction
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On Proper Phase Contrast Imaging in Aberration Corrected TEM
Microscopy and Microanalysis
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Polyethyleneimine as a Contrast Agent for Ultrastructural Localization and Characterization of Proteoglycans in the Matrix of Cartilage and Bone.
Journal of Histochemistry and Cytochemistry
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TEM Characterization of Twinning in Co39Ni33Al28 Alloy
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Characterization of Boron Containing Graphite Using TEM and EELS
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