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Publications by Isaho Kamata

Photoluminescence Imaging and Wavelength Analysis of Basal Plane Frank-Type Defects in 4h-SiC Epilayers

Materials Science Forum
2012English

Related publications

Metastable Defects in Low-Energy Electron Irradiated N-Type 4h-SiC

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Effect of Deep-Level Defects on Transient Photoconductivity of Semi-Insulating 4h-SiC

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Major Deep Levels With the Same Microstructures Observed in N-Type 4H–SiC and 6H–SiC

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Photoluminescence Properties of Erbium Doped InGaN Epilayers

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Minority Carrier Trap in N-Type 4H–SiC Schottky Barrier Diodes

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Appearance of Local Strain Fields and High Electrical Conductivity of Macro-Defects in P+-Implanted 4h-SiC

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Primary Photoluminescence in As-Neutron (Electron) -Irradiated N-Type 6h-SiC

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Microstructural Interpretation of Ni Ohmic Contact on N-Type 4H–SiC

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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