Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by J-J Bolt
Backside TEM Sample Preparation With the Multi-Loader Flip-Stage
Microscopy and Microanalysis
Instrumentation
Related publications
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation
Advances in Dual Beam TEM Sample Preparation
Microscopy and Microanalysis
Instrumentation
TEM Sample Preparation for Microcompressed Nanocrystalline Ni
Materials Transactions
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
FIB TEM Sample Preparation of Deeply Buried Interfaces
Microscopy and Microanalysis
Instrumentation
Optimization of Ion Millers for TEM Sample Preparation
Microscopy Today
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
Automated S/Tem Sample Preparation for Semiconductor Process Support
Microscopy Today
Proper Sample Preparation for Characterization of Drug Delivery Carriers in TEM
Microscopy and Microanalysis
Instrumentation
Comparison of Different TEM Sample Preparation Methods for YBa2Cu3O7-δ Type Materials
Microscopy Microanalysis Microstructures
