Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by J. Wittge
White Beam Topography of 300 Mm Si Wafers
Journal of Materials Science: Materials in Electronics
Electronic Engineering
Biomedical Engineering
Condensed Matter Physics
Biomaterials
Electronic
Molecular Physics,
Biophysics
Optical
Electrical
Atomic
Magnetic Materials
Bioengineering
Optics
Related publications
Optical Flatness Metrology for 300 Mm Silicon Wafers
AIP Conference Proceedings
Astronomy
Physics
Epitaxial Growth of GaSb and InAs Fins on 300 Mm Si (001) by Aspect Ratio Trapping
Journal of Applied Physics
Astronomy
Physics
Nano-Ridge Engineering of GaSb for the Integration of InAs/GaSb Heterostructures on 300 Mm (001) Si
Crystals
Materials Science
Inorganic Chemistry
Chemical Engineering
Condensed Matter Physics
Calculating the Surface Topography of Integrated Circuit Wafers From SEM Images
Image and Vision Computing
Electrical
Computer Vision
Signal Processing
Pattern Recognition
Electronic Engineering
Characteristics of Gettering Process in Multicrystalline Si Wafers With Combined Porous Si/Al Getters
Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
the Integration of InGaP LEDs With CMOS on 200 Mm Silicon Wafers
The Products on Si-Wafers in the Methane Plasma.
SHINKU
Epitaxial Growth of Antiphase Boundary Free GaAs Layer on 300 Mm Si(001) Substrate by Metalorganic Chemical Vapour Deposition With High Mobility
APL Materials
Materials Science
Engineering
Dislocation Structure in Low-Angle Interfaces Between Bonded Si(001) Wafers
Journal of Materials Science
Mechanics of Materials
Materials Science
Mechanical Engineering
