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Publications by J.W. Lyding
Deuterium Isotope Effect for AC and DC Hot-Carrier Degradation of MOS Transistors: A Comparison Study
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Related publications
Hot-Carrier-Induced Degradation in P-Type High-Voltage DEMOS Transistors
Effective Density-Of-States Distribution of Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Degradation
Journal of Applied Physics
Astronomy
Physics
Spatially and Temporally Resolving the Degradation of N-Channel Poly-Si Thin-Film Transistors Under Hot-Carrier Stressing
Journal of Applied Physics
Astronomy
Physics
DC and AC Characteristics of GaAs/InGaAs/AIGaAS Real Space Transfer Transistors
Active and Passive Electronic Components
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Hot-Carrier Induced Degradation in Surface pMOSFETs.
Carrier Mobility in Field-Effect Transistors
Efficiency Comparison of AC and DC Distribution Networks for Modern Residential Localities
Applied Sciences (Switzerland)
Instrumentation
Materials Science
Fluid Flow
Engineering
Computer Science Applications
Process Chemistry
Transfer Processes
Technology
Evidence for Source Side Injection Hot Carrier Effects on Lateral DMOS Transistors
Microelectronics Reliability
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Films
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Reliability
Safety
Coatings
Optics
Quality
Risk
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors Under Hot-Carrier Stress
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
