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Publications by Jang Hoan Sim
Temperature Effects of Constant Bias Stress on NFETs With Hf-Based Gate Dielectric
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Nanochemistry and Structure of Zr and Hf Based High Dielectric Constant Films
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Effects of Different Annealing Gases on Pentacene OTFT With HfLaO Gate Dielectric
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Total Dose and Bias Temperature Stress Effects for HfSiON on Si MOS Capacitors
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Reverse Gate Bias Stress on High-Voltage AlGaN/GaN-on-Si Heterostructure FETs
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AlN/GaN Insulated Gate HEMTs With HfO2 Gate Dielectric
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Positive Gate Bias Stress Instability of Carbon Nanotube Thin Film Transistors
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Operational Stability of Solution Based Zinc Tin Oxide/SiO2 Thin Film Transistors Under Gate Bias Stress
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Reliability of Buried InGaAs Channel N-MOSFETs With an InP Barrier Layer and Al2O3 Dielectric Under Positive Bias Temperature Instability Stress
Frontiers in Physics
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