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Publications by Jose M. M. M. de Almeida
Secondary Ion Mass Spectrometry Study of Erbium Titanium Codiffusion in Lithium Niobate
IEEE Photonics Technology Letters
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Related publications
Secondary Ion Mass Spectrometry (SIMS)
Zairyo to Kankyo/ Corrosion Engineering
Surfaces
Alloys
Metals
Materials Chemistry
Electrochemistry
Films
Coatings
Secondary Ion Mass Spectrometry (SIMS)
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry
Surface and Coatings Technology
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry
Journal of Research of the National Bureau of Standards
20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)
Biointerphases
Materials Science
Astronomy
Genetics
Molecular Biology
Biochemistry
Biomaterials
Chemistry
Physics
Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
Microscopy and Microanalysis
Instrumentation
Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images
Microscopy and Microanalysis
Instrumentation
Internal Energy Transfer to Secondary Ions in Electrospray Droplet Impact/Secondary Ion Mass Spectrometry
Journal of the Mass Spectrometry Society of Japan
