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Publications by Jun Yamasaki
Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode Using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM
Microscopy and Microanalysis
Instrumentation
Observation of Local Strain in InxGa1-xAs Quantum Dots by Spherical-Aberration Corrected HRTEM
Materia Japan
Direct Observations of Site Hopping of Individual Antimony Atoms in Silicon Crystals by Cs-Corrected STEM
Materia Japan
Observation of Atomic Columns by Diffractive Imaging^|^mdash;Reconstruction of the Si Dumbbell Structure From a Selected Area Diffraction Pattern^|^mdash;
Materia Japan
