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Publications by Kun Hee Ko
Erratum: “Spectroscopic Ellipsometry-Based Study of Optical Properties of Amorphous and Crystalline ZnSnO Alloys and Zn2SnO4 Thin Films Grown Using Sputtering Deposition: Dielectric Function and Subgap States” [J. Appl. Phys. 119, 135302 (2016)]
Journal of Applied Physics
Astronomy
Physics
Related publications
Erratum: “Effects of Low-Temperature-Buffer, Rf-Power, and Annealing on Structural and Optical Properties of ZnO/Al2O3(0001) Thin Films Grown by Rf-Magnetron Sputtering” [J. Appl. Phys. 106, 023511 (2009)]
Journal of Applied Physics
Astronomy
Physics
Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Dielectric and Optical Properties of Zr Silicate Thin Films Grown on Si(100) by Atomic Layer Deposition
Journal of Applied Physics
Astronomy
Physics
Morphology and Spectroscopic Ellipsometry of PMMA Thin Films
Applied Physics Research
Magnetic Properties of Mn Doped Crystalline and Amorphous Ge Thin Films Grown on Si (111)
Turkish Journal of Physics
Astronomy
Physics
Thermo Optical Properties and Related Electronic Polarizabilities of MoO3 Thin Films Using Ellipsometry
American Journal of Engineering and Applied Sciences
Geotechnical Engineering
Energy Engineering
Engineering Geology
Engineering
Chemical Engineering
Power Technology
Environmental Engineering
Computer Science
Dielectric Function and Optical Properties of Al-Rich AlInN Alloys Pseudomorphically Grown on GaN
Journal of Physics D: Applied Physics
Surfaces
Ultrasonics
Condensed Matter Physics
Acoustics
Optical
Magnetic Materials
Films
Coatings
Electronic
Spectroscopic and Electrochromic Properties of Activated Reactive Evaporated Nano-Crystalline V2O5 Thin Films Grown on Flexible Substrates
International Nano Letters
Medicine
Bioengineering
Biomedical Engineering
Pharmaceutical Science
Retraction: Grain Size and Strain Effects on the Optical and Electrical Properties of Hafnium Oxide Nanocrystalline Thin Films [J. Appl. Phys. 108, 083529 (2010)]
Journal of Applied Physics
Astronomy
Physics
