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Publications by L.M. Gordon
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Related publications
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
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Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography—A Cornerstone in Materials Characterization
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Promoting Standards in Quantitative Atom Probe Tomography Analysis
Microscopy and Microanalysis
Instrumentation
Modeling Mass Spectrometry Profiles in Atom Probe Tomography
Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
Instrumentation
Introduction: Special Issue on Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
Advanced Materials Interfaces
Mechanics of Materials
Mechanical Engineering
Simplifying Observation of Hydrogen Trapping in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
