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Publications by M. Rafik
Mean Time to Failure Distribution in Thin Oxide Film: Observation at Nano and Devices Scale and Modelling Using a Filamentary Growth Model
Highly Manufacturable and Cost-Effective Single TaxC / HfxZr(1-x)O2 Gate CMOS Bulk Platform for LP Applications at the 45nm Node and Beyond
Highly Scalable and WF-tunable Ni(Pt)Si/SiON TOSI-gate CMOS Devices Obtained in a CMP-less Integration Scheme
