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Publications by Mark J Talbot
Cell Surface and Cell Outline Imaging in Plant Tissues Using the Backscattered Electron Detector in a Variable Pressure Scanning Electron Microscope
Plant Methods
Biotechnology
Plant Science
Genetics
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Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2
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Imaging of Shallow Surface Topography by the Low-Loss Electron (LLE) Method in the Scanning Electron Microscope
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Time Resolved Analysis of the Positive Ion Dynamics in the Variable Pressure Scanning Electron Microscope
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Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope
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Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope
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Modeling Contrasts in Variable Pressure Scanning Electron Microscopes
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Scanning Electron Microscope
Micron (1969)