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Publications by Mukesh Bachhav
Challenges and Opportunities on Elucidating Irradiated Fuels With Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
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Introduction: Special Issue on Atom Probe Tomography
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New Applications in Atom Probe Tomography
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An Introduction to Atom Probe Tomography
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Atom Probe Tomography Characterization of Multilayer Films
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Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
Advanced Materials Interfaces
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Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
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Atom-Probe Tomography of Semiconductor Materials and Device Structures
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Atom Probe Tomography: A Technique for Nanoscale Characterization
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Atom Probe Tomography—A Cornerstone in Materials Characterization
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