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Publications by N. J. Podraza
Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Related publications
Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
Morphology and Spectroscopic Ellipsometry of PMMA Thin Films
Applied Physics Research
New Features of the Layer‐by‐layer Deposition of Microcrystalline Silicon Films Revealed by Spectroscopic Ellipsometry and High Resolution Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Quantitative Photopyroelectric Out-Of-Phase Spectroscopy of Amorphous Silicon Thin Films Deposited on Crystalline Silicon
Canadian Journal of Physics
Astronomy
Physics
In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes
Determination of Complex Dielectric Functions of Ion Implanted and Implanted‐annealed Amorphous Silicon by Spectroscopic Ellipsometry
Journal of Applied Physics
Astronomy
Physics
Solid-Phase Crystallization of Amorphous Silicon Films
In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
