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Publications by Paul Ronsheim

Atom-Probe Tomography of Semiconductor Materials and Device Structures

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2009English

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Atom Probe Tomography—A Cornerstone in Materials Characterization

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Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

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Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography

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The Mystery of Missing Species in Atom Probe Tomography of Composite Materials

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Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography

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Atom Probe Tomography and Correlative Microscopy: 3D Nanoscale Characterization of Metals, Minerals and Materials

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New Applications in Atom Probe Tomography

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An Introduction to Atom Probe Tomography

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Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis
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2003English

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