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Publications by Pengtao Chai
New Attempts on Preparing Tungsten FIB Sample
Microscopy and Microanalysis
Instrumentation
Related publications
Planarization Processes for Pre-Fib Sample Preparation
Microscopy and Microanalysis
Instrumentation
FIB TEM Sample Preparation of Deeply Buried Interfaces
Microscopy and Microanalysis
Instrumentation
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
Advancing FIB Assisted 3D EBSD Using a Static Sample Setup
Ultramicroscopy
Instrumentation
Optics
Molecular Physics,
Optical
Atomic
Magnetic Materials
Electronic
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation
Preparing Principals: New Directions
Educational Considerations
Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries
Microscopy and Microanalysis
Instrumentation
The Bleep Experience: Preparing New Doctors for On-Call Shifts
Future Healthcare Journal
A New Method of Preparing Tuberculin
BMJ
