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Publications by Philip L. Flaitz
Atom-Probe Tomography of Semiconductor Materials and Device Structures
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Related publications
Atom Probe Tomography—A Cornerstone in Materials Characterization
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
The Mystery of Missing Species in Atom Probe Tomography of Composite Materials
Applied Physics Letters
Astronomy
Physics
Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography and Correlative Microscopy: 3D Nanoscale Characterization of Metals, Minerals and Materials
JOM
Materials Science
Engineering
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
Instrumentation
