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Publications by Rene Heller
Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
Microscopy and Microanalysis
Instrumentation
Related publications
Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging
Microscopy and Microanalysis
Instrumentation
Gridless Ion Acceleration Systems for Time-Of-Flight Mass Spectrometry
Journal of the American Society for Mass Spectrometry
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Ion Storage Techniques and Time-Of-Flight Mass Spectrometry in Physical Forensic Science
Towards Secondary Ion Mass Spectrometry on the Helium Ion Microscope: An Experimental and Simulation Based Feasibility Study With He+ and Ne+ Bombardment
Applied Physics Letters
Astronomy
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Selective Reagent Ion-Time of Flight-Mass Spectrometry Study of Six Common Monoterpenes
International Journal of Mass Spectrometry
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Feasibility of Ultra-Performance Liquid Chromatography–ion Mobility–time-Of-Flight Mass Spectrometry in Analyzing Oxysterols
Journal of Chromatography A
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Writing Nanometer-Scale Pits in Sputtered Carbon Films Using the Scanning Tunneling Microscope
Applied Physics Letters
Astronomy
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Chemical Imaging of Buried Interfaces in OrganicInorganic Devices Using Focused Ion Beam-Time-Of-Flight-Secondary-Ion Mass Spectrometry
Atom Probe Field Ion Microscope Study of the Range and Diffusivity of Helium in Tungsten
