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Publications by S. Deora
A Common Framework of NBTI Generation and Recovery in Plasma-Nitrided SiON P-MOSFETs
IEEE Electron Device Letters
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Related publications
Recovery of CHC- And NBTI-induced Degradation on MOSFETs by Using Different Annealing Treatments
Model and Analysis of Gate Leakage Current in Ultrathin Nitrided Oxide MOSFETs
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
A Mossbauer Study of Plasma Nitrided Iron
Threshold-Voltage Instability in 4h-SiC MOSFETs With Nitrided Gate Oxide Revealed by Non-Relaxation Method
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Effect of Post Treatment in Argon Environment of Plasma Nitrided Local Disc Brake
Advances in Materials
On a Paper of Maurice Sion
Canadian Journal of Mathematics
Mathematics
A 65nm CMOS 400ns Measurement Delay NBTI-Recovery Sensor by Minimum Assist Circuit
Microstructural, Mechanical, and Corrosion Characterization of Plasma-Nitrided Plastic Injection Mould Steel
Surface and Coatings Technology
Surfaces
Condensed Matter Physics
Interfaces
Materials Chemistry
Films
Coatings
Chemistry
High Performance, Strained-Ge, Heterostructure P-MOSFETs
