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Publications by S. Marsillac
Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Optical Properties of Wide Band Gap Indium Sulphide Thin Films Obtained by Physical Vapor Deposition
physica status solidi (a)
Related publications
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Morphology and Spectroscopic Ellipsometry of PMMA Thin Films
Applied Physics Research
Thermo Optical Properties and Related Electronic Polarizabilities of MoO3 Thin Films Using Ellipsometry
American Journal of Engineering and Applied Sciences
Geotechnical Engineering
Energy Engineering
Engineering Geology
Engineering
Chemical Engineering
Power Technology
Environmental Engineering
Computer Science
Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
Spectroscopic Ellipsometry, Optical, Structural and Electrical Investigation of Sprayed Pure and Sn-Doped ZnO Thin Films
EPJ Web of Conferences
Astronomy
Physics
In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes
Dielectric Properties of Lignin and Glucomannan as Determined by Spectroscopic Ellipsometry and Lifshitz Estimates of Non-Retarded Hamaker Constants
Cellulose
Polymers
Plastics
In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
