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Publications by S.S. Chung
The Impact of Positive Bias Temperature Instabilities on Stacked High-K/Metal Gate Transistor With TiN Barrier Layer
A New Approach to Simulating N-Mosfet Gate Current Degradation by Including Hot-Electron Induced Oxide Damage
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
