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Publications by Si-Ming Chiou
Turn-Around Phenomenon in the Degradation Trend of N-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors Under DC Bias Stress
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Related publications
Low-Temperature Growth Process of Polycrystalline Silicon for Thin Film Transistors.
SHINKU
Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Effective Density-Of-States Distribution of Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Degradation
Journal of Applied Physics
Astronomy
Physics
Instability of Threshold Voltage Under DC Drain Bias Stress in Pentacene-Based Organic Thin Film Transistors
Bias Stress Effects in Organic Thin Film Transistors
Gate-All-Around Polycrystalline-Silicon Thin-Film Transistors With Self-Aligned Grain-Growth Nanowire Channels
Applied Physics Letters
Astronomy
Physics
Suppress Temperature Instability of InGaZnO Thin Film Transistors by N2O Plasma Treatment, Including Thermal-Induced Hole Trapping Phenomenon Under Gate Bias Stress
Applied Physics Letters
Astronomy
Physics
Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors
Instability of Amorphous-Indium Gallium Zinc Oxide (A-Igzo) Thin Film Transistors Under DC and AC Bias Stress
