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Publications by Simon P. Ringer

Introduction: Special Issue on Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2007English

Related publications

An Introduction to Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2003English

New Applications in Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2013English

Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis
Instrumentation
2003English

Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)

Advanced Materials Interfaces
Mechanics of MaterialsMechanical Engineering
2017English

Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM

Microscopy and Microanalysis
Instrumentation
2013English

Atom Probe Tomography: A Technique for Nanoscale Characterization

Microscopy and Microanalysis
Instrumentation
2002English

Atom Probe Tomography—A Cornerstone in Materials Characterization

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2016English

Promoting Standards in Quantitative Atom Probe Tomography Analysis

Microscopy and Microanalysis
Instrumentation
2009English

Nanostructure Analysis by Laser Assisted Atom Probe Tomography

Vacuum and Surface Science
2018English

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