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Publications by Sobhan Babu Ch.
Optimal Don’t Care Filling for Minimizing Peak Toggles During At-Speed Stuck-At Testing
ACM Transactions on Design Automation of Electronic Systems
Computer Science Applications
Electronic Engineering
Computer Graphics
Electrical
Computer-Aided Design
Dp-Fill: A Dynamic Programming Approach to X-Filling for Minimizing Peak Test Power in Scan Tests
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Synthesis Methodology for Built-In At-Speed Testing
On Coding for 'Stuck-At' Defects (Corresp.)
IEEE Transactions on Information Theory
Computer Science Applications
Information Systems
Library
Information Sciences
Spectral RTL Test Generation for Gate-Level Stuck-At Faults
Proceedings of the Asian Test Symposium
Electronic Engineering
Electrical
Wave-Speed-Determined Flow Limitation at Peak Flow in Normal and Asthmatic Subjects
Journal of Applied Physiology
Medicine
Physiology
Sports Science
Short Single Tests for Logic Networks Under Arbitrary Stuck-At Faults at Outputs of Gates
Keldysh Institute Preprints
Energy: Oilman at the Peak
Nature
Multidisciplinary
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Laser Development at Q-Peak for Remote Sensing
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
