Discover open access scientific publications

Search, annotate, share and cite publications

Publications by T. Mitch Wallis

Metrology for High-Frequency Nanoelectronics

AIP Conference Proceedings
AstronomyPhysics
2007English

Related publications

TSOM Method for Nanoelectronics Dimensional Metrology

2011English

Metrology (Including Materials Characterization) for Nanoelectronics

AIP Conference Proceedings
AstronomyPhysics
2005English

Advanced Metrology for Nanoelectronics at the National Institute of Standards and Technology

2009English

Laser Generated Ultrasound Sources Using Polymer Nanocomposites for High Frequency Metrology

2017English

All-Normal-Dispersion Fiber Lasers for Frequency Metrology

2011English

Process Modules for GeSn Nanoelectronics With High Sn-Contents

2016English

Frequency Metrology in Quantum Degenerate Helium

EPJ Web of Conferences
AstronomyPhysics
2013English

Introduction to Time and Frequency Metrology

Review of Scientific Instruments
MedicineInstrumentation
1999English

Frequency Metrology on theMg3s2S1→3s4pP1line for Comparison With Quasar Data

Physical Review A
2006English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy