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Publications by T. P. Ma

Study of Gate Oxide Traps in HfO2/AlGaN/GaN Metal-Oxide-Semiconductor High-Electron-Mobility Transistors by Use of Ac Transconductance Method

Applied Physics Letters
AstronomyPhysics
2013English

Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta2O9 With Cross-Sectional Atomic Force Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

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