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Publications by Thomas Schülein
Rapid EDS Element Images for Image Analysis – A New Application of the XFlash® X-Ray Detector Technology at the Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
Related publications
Strategies for X-Ray Analysis of Non-Conductive Specimens in a Conventional Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
Quantitative X-Ray Microanalysis With a Low Voltage Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
Wavelet-Based Image Restoration of Compact X-Ray Microscope Images
Journal de Physique IV (Proceedings)
Soft X-Ray Spectromicroscopy Using Compact Scanning Transmission X-Ray Microscope at the Photon Factory
Trace-Element Analysis of Steller Sea Lion (Eumetopias Jubatus) Teeth Using a Scanning X-Ray Analytical Microscope
Mammal Study
Animal Science
Zoology
Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope
Advances in OptoElectronics
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Characterization of a Thick Layer A-Si:H Pixel Detector With TFA Technology Using a Scanning Electron Microscope
Journal of Non-Crystalline Solids
Condensed Matter Physics
Materials Chemistry
Optical
Magnetic Materials
Composites
Electronic
Ceramics
Application of Immunohistochemical Staining to Scanning Electron Microscopy - A New Method of Comparative Studies of the Same Cells With Light Microscope and Scanning Electron Microscope.
The Journal of the Japanese Society of Clinical Cytology
Three-Dimensional Visualization of Golgi-Stained Neurons by a Projection X-Ray Microscope Converted From a Scanning Electron Microscope.
Tohoku Journal of Experimental Medicine
Biochemistry
Medicine
Genetics
Molecular Biology
