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Publications by Yongchan Ban
Electrical Impact of Line-Edge Roughness on Sub-45nm Node Standard Cell
Related publications
Understanding the Effect of Laser Anneal on LSTP 45nm Node MOS Transistor Electrical Parameters
Special Section Guest Editorial: Line-Edge Roughness
Journal of Micro/ Nanolithography, MEMS, and MOEMS
Electronic Engineering
Condensed Matter Physics
Mechanical Engineering
Electronic
Molecular Physics,
Nanoscience
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Optics
Analytic Estimation and Minimization of Line Edge Roughness in Electron-Beam Lithography
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Effect of Double-Patterning and Double-Etching on the Line-Edge-Roughness of Multi-Gate Bulk MOSFETs
IEICE Electronics Express
Electronic Engineering
Condensed Matter Physics
Optical
Electrical
Magnetic Materials
Electronic
Chemically Amplified Main Chain Scission: New Concept to Reduce Line Edge Roughness and Outgassing.
Journal of Photopolymer Science and Technology
Organic Chemistry
Polymers
Materials Chemistry
Plastics
Impact of Lymph Node Management on Resectable Non-Small Cell Lung Cancer Patients
Journal of Thoracic Disease
Pulmonary
Respiratory Medicine
Determination of Optimum Thermalization Distance Based on Trade-Off Relationship Between Resolution, Line Edge Roughness and Sensitivity of Chemically Amplified Extreme Ultraviolet Resists
Journal of Photopolymer Science and Technology
Organic Chemistry
Polymers
Materials Chemistry
Plastics
Cell Edge Detector: Recovering Length Information From Line-Scan Confocal Images
Biophysical Journal
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Influence of Anomalous Roughness Growth on the Electrical Conductivity of Thin Films
Physical Review B
